The Testing Center will be closed for maintenance on Friday, December 12, and will close early at 7 pm the week of Monday, December 15, through Thursday, December 18, and will close at noon on Friday, December 19.
Solid State Devices (CETT 1429)
Term: 2016-2017 Spring
Tue-Thu, 8:00 AM - 2:50 PM (1/9/2017 - 5/11/2017) Location: MAIN CECA 100B
A circuit analysis of the operating characteristics and biasing of various devices used for generation and amplification of signal currents. The study includes diodes, bipolar transistors and field-effect transistors. Prerequisite: CETT 1403.